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Physically realistic fault models for analog CMOS neural networks

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2 Author(s)
Feltham, D.B.I. ; Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA ; Maly, W.

A general methodology for the development of physically realistic fault models for VLSI neural networks is presented. The derived fault models are explained and characterized in detail. The application of this methodology to an analog CMOS implementation of fixed-weight (i.e., pretrained), binary-valued neural networks is reported. It is demonstrated that these techniques can be used to accurately evaluate defect sensitivities in VLSI neural network circuitry. It is also shown that this information can be used to guide the design of circuitry which fully utilizes a neural network's potential for defect tolerance

Published in:

Solid-State Circuits, IEEE Journal of  (Volume:26 ,  Issue: 9 )

Date of Publication:

Sep 1991

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