By Topic

Fault analysis of the multiple valued logic using spectral method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Kim, J.O. ; Dept. of Electr. Eng., Dongyang Tech. Coll., Seoul, South Korea ; Lala, P. ; Young Gun Kim ; Heung Soo Kim

A method for detecting faults in Multiple Valued Logic (MVL) is proposed. The method depends on analyzing the spectral coefficients that are transformed for the Chrestenson spectral domain. The fault detecting conditions are derived for a single input stuck-at fault, multiple input s-a-f, a s-a-f at internal lines, and Min/Max bridging fault of the MVL. Fault detection is done based on the number of coefficients affected by a fault, and hence it is independent of the technology used for construction of networks and the types of fault. This method allows detection of the fault without the test vector, and minimize the memory size for storing test vectors and response data

Published in:

Multiple-Valued Logic, 2000. (ISMVL 2000) Proceedings. 30th IEEE International Symposium on

Date of Conference: