By Topic

A new interactive graphic user interface and mesh generator for 3D TWT collector analysis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Coco, S. ; DEES, Catania Univ., Italy ; Emma, F. ; Laudani, A. ; Pulvirenti, S.
more authors

Simulators for electromagnetic analysis of TWT collectors require manipulation of a large amount of information both in the input and in the post-processing phases. Efficient, user-friendly interfaces greatly enhance the design capability of these tools by guiding the designer through a step by step process, during which full control of choices is kept and correctness of input information is assured. In this paper the authors intend to present a new dedicated interactive Graphic User Interface (GUI) which includes an automatic mesh generator, designed for the COCA simulator, a novel 3D FE tool for TWT collector analysis, developed at the University of Catania under an ESA/ESTEC project. Differently from other interfaces, dedicated only to result restitution, the Graphic User Interface of COCA aims at facilitating the management of all the various aspects of a simulation session. These range from input of geometries for the FE mesh generation to FE model processing and output postprocessing. The mesh generator has two operation modes a dedicated deterministic one and a neural one. The neural mode generates meshes which evolve from an initial simple configuration in such a way to approach a user-defined mesh density in critical regions.

Published in:

Vacuum Electronics Conference, 2000. Abstracts. International

Date of Conference:

2-4 May 2000