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Function dependent fully testable programmable logic array

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3 Author(s)
M. A. Mottalib ; Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India ; R. V. S. K. Prasad ; P. Dasgupta

Two techniques for designing function-dependent easily testable programmable logic arrays are presented. The techniques can detect all the multiple stuck-at, crosspoint and bridging faults, as compared with most of the existing techniques where some of the faults, especially bridging faults, remain undetected.

Published in:

Electronics Letters  (Volume:27 ,  Issue: 6 )