Cart (Loading....) | Create Account
Close category search window
 

Novel technique for the systematic measurement of gain, absolute refractive index spectra, and other parameters of semiconductor lasers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Wu, Linzhang ; 4. Phys. Inst., Stuttgart Univ., Germany ; Fu, Liwei

To characterize semiconductor lasers, it is often required to measure parameters such as the quasi Fermi-level separation, intrinsic optical loss, the position of the gain peak, and gain and absolute refractive index spectra. For these measurements, there are many different techniques available, but they neglect to take into account the dispersion of refractive index and cannot be used to extract the absolute refractive index spectrum. A novel technique is proposed to systematically and accurately measure all these parameters of semiconductor lasers. Compared with techniques often used, which will be briefly reviewed in the paper, this novel technique has the following advantages: (1) the determination process uses only the measured spontaneous emission spectra, without the requirement for knowledge of such parameters as intrinsic optical loss, facet reflectivity, and waveguide confinement factor, which presently are difficult to check experimentally; (2) results are obtained for each given current (for example, this technique measures intrinsic optical loss for each given current, rather than the average one over the whole current range); (3) the dispersion of refractive index is taken into account; (4) both the absolute refractive index spectrum for a given current and its change with current can be accurately measured; (5) the gain spectra and refractive index can be measured as wide as one wants; (6) the measurement accuracy is improved; and (7) no adjustable parameter or recalibration is needed.

Published in:

Quantum Electronics, IEEE Journal of  (Volume:36 ,  Issue: 6 )

Date of Publication:

June 2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.