Notification:
We are currently experiencing intermittent issues impacting performance. We apologize for the inconvenience.
By Topic

STBM: a fast algorithm to simulate IDDQ tests for leakage faults

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Chakravarty, S. ; Test Technol., Intel Corp., Santa Clara, CA, USA ; Zachariah, S.T.

State-transition-based method (STBM), a fast algorithm for computing leakage fault coverage of IDDQ tests and selecting optimal IDDQ measurement points, targeting leakage faults, is presented. Experimental results presented show that STBM outperforms all known algorithms for the same problems. A comparative study of leakage and pseudo-stuck-at fault models, the latter used by commercial tool vendors, show that the pseudo-stuck-at coverage values are very pessimistic

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:19 ,  Issue: 5 )