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STBM: a fast algorithm to simulate IDDQ tests for leakage faults

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2 Author(s)
Chakravarty, S. ; Test Technol., Intel Corp., Santa Clara, CA, USA ; Zachariah, S.T.

State-transition-based method (STBM), a fast algorithm for computing leakage fault coverage of IDDQ tests and selecting optimal IDDQ measurement points, targeting leakage faults, is presented. Experimental results presented show that STBM outperforms all known algorithms for the same problems. A comparative study of leakage and pseudo-stuck-at fault models, the latter used by commercial tool vendors, show that the pseudo-stuck-at coverage values are very pessimistic

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Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:19 ,  Issue: 5 )