Cart (Loading....) | Create Account
Close category search window
 

Measuring jitter and phase error in microprocessor phase-locked loops

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Jenkins, K.A. ; IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA ; Eckhardt, J.P.

The use of phase-locked loops (PLLs) for clock generation in modern microprocessors has been proliferating in recent years. This is because PLLs have the advantages of allowing multiplication of the reference clock frequency and allowing phase alignment between chips. The PLL locks to a reference clock but can generate output clocks that are a multiple of the reference. It is argued that excessive “jitter”, caused primarily by power supply noise, can detract from the advantages of phase-locked loops. Moreover, in a multichip system, the accumulated phase error must be measured-not just the jitter

Published in:

Design & Test of Computers, IEEE  (Volume:17 ,  Issue: 2 )

Date of Publication:

Apr-Jun 2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.