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High-level observability for effective high-level ATPG

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3 Author(s)
Corno, F. ; Dipt. di Autom. e Inf., Politecnico di Torino, Italy ; Reorda, M.S. ; Squillero, G.

This paper focuses on observability, one of the open issues in high-level test generation. Three different approximate metrics for taking observability into account during RT-level ATPG are presented. Metrics range from a really naive and optimistic one to more sophisticated analysis. Metrics are evaluated including them in the calculation of the fitness function used in a RT-level ATPG. Advantages and disadvantages are illustrated. Experimental results show how sharp observability metrics are crucial for making effective RT-level ATPG possible: test sequences generated at RT-level outperform commercial gate-level ATPGs on some ITC99 benchmark circuits

Published in:

VLSI Test Symposium, 2000. Proceedings. 18th IEEE

Date of Conference:

2000