Cart (Loading....) | Create Account
Close category search window
 

On test set generation for efficient path delay fault diagnosis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Tekumalla, R.C. ; Intel Corp., Hillsboro, OR, USA

Path delay fault testing has been widely pursued in literature, primarily because of the need for determining the optimal speed of circuit operation. The existing techniques for path delay fault diagnosis are oriented towards determining the delay defects based on a given test set. In this paper, we propose a method for modifying a given test set such that the resultant test set is more effective in determining paths with excessive delays. The process of modifying the given test set is built upon an accurate algorithm for identifying all the single and multiple faults static sensitized by a given test set. The tests are then ordered such that it becomes faster and easier to identify paths responsible for timing failures. The modified test set results in an overall improvement in test quality and better diagnosis. The proposed approach can be used before test application for modifying the test set and improving diagnosis. Experiments are performed on the ISCAS' 89 and MCNC' 91 benchmark circuits to show the effectiveness of the proposed method for path delay fault diagnosis

Published in:

VLSI Test Symposium, 2000. Proceedings. 18th IEEE

Date of Conference:

2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.