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Detection of inter-port faults in multi-port static RAMs

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4 Author(s)
Zhao, J. ; Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA ; Irrinki, S. ; Puri, M. ; Lombardi, F.

This paper deals with testing of inter-port faults in multi-port static random access memories (SRAMs). An inter-port fault is caused by a short between word/bit lines of different ports in a multi-port SRAM. By considering different implementations of the SRAM and its layout, an approach with achieves 100% coverage of fault detection, is proposed. The two-step approach is based on two novel algorithms: MMCA (Modified March C Algorithm) and WIPD (Write Inter-Port Detection). It is shown that inter-port fault detection is a combinatorial problem; hence, MMCA and WIPD must be executed a multiple number of times depending on the types, number of ports and line arrangement in the layout

Published in:

VLSI Test Symposium, 2000. Proceedings. 18th IEEE

Date of Conference:

2000