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SIFAR: static test compaction for synchronous sequential circuits based on single fault restoration

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4 Author(s)
Xijiang Lin ; Mentor Graphics Corp., Wilsonville, OR, USA ; Wu-Tung Cheng ; Pomeranz, I. ; Reddy, S.M.

We propose a new approach for implementing static compaction procedures for synchronous sequential circuits. The procedures we consider belong to the class of procedures that generate the compacted test sequence through restoration of segments (or subsequences) of a given test sequence T. Under the proposed approach, each restored segment detects a single target fault chosen from the faults detected by T at one time unit. A novel parallel pattern simulator is developed for this purpose. Experimental results for benchmark circuits are included

Published in:

VLSI Test Symposium, 2000. Proceedings. 18th IEEE

Date of Conference:

2000