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Test selection based on high level fault simulation for mixed-signal systems

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2 Author(s)
Ozev, S. ; Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA ; Orailoglu, A.

Mixed-signal design and test tools are failing to keep pace with the increasing necessity for design exploration in the early stages. We outline a methodology and toolset to enable test selection at the early design stages by providing a high level fault simulator and associated block-level modeling and traversal capabilities. Experimental results show that the outlined methodology provides superior fault simulation speed-ups while helping to minimize the test time for a mixed-signal receiver system

Published in:

VLSI Test Symposium, 2000. Proceedings. 18th IEEE

Date of Conference:

2000