Cart (Loading....) | Create Account
Close category search window

BSM2: next generation boundary-scan master

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Higgins, F.P. ; Lucent Technol. Bell Labs., Princeton, NJ, USA ; Srinivasan, R.

Boundary-scan (B-S) strategies require successful coordination of B-S activities for the devices integrated on boards and systems. The original Boundary-Scan Master (BSM) chip was developed to achieve this coordination. We have recently designed the next generation version, named BSM2, that provides a more flexible architecture and a more complete set of features as compared to the original BSM. In this paper, we describe the architectural features of BSM2 device highlighting various scan modes, automatic scan sequencing and gated clock support. We also describe the verification and testing strategies for the design including the backward compatibility with the original BSM features. DFT structures are added to the device to achieve both high fault coverage and self-test capability, as this device forms the test conduit for board and system-level testing. Finally, we briefly discuss the device support for addressable scan port (ASP) protocol and its usage in DSP applications

Published in:

VLSI Test Symposium, 2000. Proceedings. 18th IEEE

Date of Conference:


Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.