Close category search window
 

A truncated Floquet wave diffraction method for the full-wave analysis of large phased arrays .II. Generalization to 3-D cases

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Neto, A. ; Coll. of Eng., Siena Univ., Italy ; Maci, S. ; Vecchi, G. ; Sabbadini, M.

For pt.I see ibid., vol.48, no.3, p.594-600 (2000). This paper deals with the generalization to three-dimensional (3-D) arrays of the truncated Floquet wave (TFW) diffraction method for the full-wave analysis of large arrays. This generalization potentially includes arrays consisting of microstrip excited slots, cavity-backed apertures, and patches. The formulation is carried out first by deriving an appropriate fringe integral equation (IE) and next by defining entire domain basis functions in terms of global-array functions shaped as TFW diffracted rays whose analytical expression is derived on the basis of prototype canonical problems. The efficiency and the accuracy of this method is demonstrated by comparison with the results of an element-by-element full wave approach for a rectangular slot array

Published in:
Antennas and Propagation, IEEE Transactions on  (Volume:48 ,  Issue: 4 )

Date of Publication: Apr 2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.