Scheduled System Maintenance:
Some services will be unavailable Sunday, March 29th through Monday, March 30th. We apologize for the inconvenience.
By Topic

The cost of recovery in message logging protocols

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Rao, S. ; Dept. of Comput. Sci., Texas Univ., Austin, TX, USA ; Alvisi, L. ; Vin, H.M.

Past research in message logging has focused on studying the relative overhead imposed by pessimistic, optimistic and causal protocols during failure-free executions. In this paper, we give the first experimental evaluation of the performance of these protocols during recovery. Our results suggest that applications face a complex tradeoff when choosing a message logging protocol for fault tolerance. On the one hand, optimistic protocols can provide fast failure-free execution and good performance during recovery, but are complex to implement and can create orphan processes. On the other hand, orphan-free protocols either risk being slow during recovery (e.g. sender-based pessimistic and causal protocols) or incur a substantial overhead during failure-free execution (e.g. receiver-based pessimistic protocols). To address this tradeoff, we propose hybrid logging protocols, which are a new class of orphan-free protocols. We show that hybrid protocols perform within 2% of causal logging during failure-free execution and within 2% of receiver-based logging during recovery

Published in:

Knowledge and Data Engineering, IEEE Transactions on  (Volume:12 ,  Issue: 2 )