IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Journals & Magazines > Electronics Letters ...> Volume:36 Issue:7 Help

Autocorrelation of femtosecond pulses from 415-630 nm using GaN laser diode

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Loza-Alvarez, P. ; J.F. Allen Res. Labs., St. Andrews Univ., UK ; Sibbett, W. ; Reid, D.T.

Using the two-photon response of a commercial 39 3nm GaN laser diode the authors have measured intensity and interferometric second-order autocorrelations of visible femtosecond pulses in the 415-630 nm wavelength region for pulse energies as low as 1 pJ

Published in:
Electronics Letters  (Volume:36 ,  Issue: 7 )

Date of Publication: 30 Mar 2000

Page(s):
631 - 633
ISSN :
0013-5194
INSPEC Accession Number:
6568548
Digital Object Identifier :
10.1049/el:20000530
Date of Current Version :
06 August 2002
Issue Date :
30 Mar 2000
Sponsored by :
Institution of Engineering and Technology

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.