Cart (Loading....) | Create Account
Close category search window
 

Beam-quality studies of nanosecond singly resonant optical parametric oscillators

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Lyons, S.C. ; Dept. of Phys. & Appl. Phys., Strathclyde Univ., Glasgow, UK ; Oppo, G.-L. ; Firth, W.J. ; Barr, J.R.M.

A numerical model for a singly resonant, nondegenerate optical parametric oscillator, which includes diffraction and idler absorption, has been developed. This model requires just one equation for the resonated signal field to be numerically integrated, while the pump and idler fields are reconstructed from their analytic solutions and the dynamics of the signal field. Typical results from our simulations are, for example, output intensities and threshold fluencies, which can be compared with those obtained from experiments. The spatial beam quality of output beams produced by our model is evaluated via the M/sup 2/ factor. We present results from the simulation which are consistent with experimental evidence, particularly in reference to the impact of idler absorption.

Published in:

Quantum Electronics, IEEE Journal of  (Volume:36 ,  Issue: 5 )

Date of Publication:

May 2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.