Cart (Loading....) | Create Account
Close category search window
 

On the characterization of agricultural soil roughness for radar remote sensing studies

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Davidson, M. ; Centre d''Etudes de la Biosphere, Toulouse, France ; Thuy Le Toan ; Mattia, F. ; Satalino, G.
more authors

The surface roughness parameters commonly used as inputs to electromagnetic surface scattering models (SPM, PO, GO, and IEM) are the root mean square (RMS) height s, and autocorrelation length l. However, soil moisture retrieval studies based on these models have yielded inconsistent results, not so much because of the failure of the models themselves, but because of the complexity of natural surfaces and the difficulty in estimating appropriate input roughness parameters. In this paper, the authors address the issue of soil roughness characterization in the case of agricultural fields having different tillage (roughness) states by making use of an extensive multisite database of surface profiles collected using a novel laser profiler capable of recording profiles up to 25 m long. Using this dataset, the range of RMS height and correlation values associated with each agricultural roughness state is estimated, and the dependence of these estimates on profile length is investigated. The results show that at spatial scales equivalent to those of the SAR resolution cell, agricultural surface roughness characteristics are well described by the superposition of a single scale process related to the tillage state with a multiscale random fractal process related to field topography.

Published in:

Geoscience and Remote Sensing, IEEE Transactions on  (Volume:38 ,  Issue: 2 )

Date of Publication:

March 2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.