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A minimal universal test set for self-test of EXOR-Sum-of-Products circuits

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3 Author(s)
Kalay, U. ; Dept. of Electr. & Comput. Eng., Portland State Univ., OR, USA ; Hall, D.V. ; Perkowski, M.A.

A testable EXOR-Sum-of-Products (ESOP) circuit realization and a simple, universal test set which detects all single stuck-at faults in the internal lines and the primary inputs/outputs of the realization are given. Since ESOP is the most general form of AND-EXOR representations, our realization and test set are more versatile than those described by other researchers for the restricted GRM, FPRM, and PPRM forms of AND-EXOR circuits. Our circuit realization requires only two extra inputs for controllability and one extra output for observability. The cardinality of our test set for an n input circuit is (n+6). For Built-in Self-Test (BIST) applications, we show that our test set can be generated internally as easily as a pseudorandom pattern and that it provides 100 percent single stuck-at fault coverage. In addition, our test set requires a much shorter test cycle than a comparable pseudoexhaustive or pseudorandom test set

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Computers, IEEE Transactions on  (Volume:49 ,  Issue: 3 )