By Topic

Spectroscopic imaging using terahertz time-domain signals

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Dorney, T.D. ; Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX ; Baraniuk, R.G. ; Mittleman, D.M.

Imaging systems based on terahertz time-domain spectroscopy offer a range of unique modalities due to the broad bandwidth, sub-picosecond duration, and phase-sensitive detection of the terahertz pulses. Furthermore, an exciting possibility exists to combine spectroscopic characterization and/or identification with imaging because the radiation is broadband in nature. In order to achieve this, novel methods for real-time analysis of terahertz waveforms are required. Unfortunately, both the absorption and the phase delay of a transmitted terahertz pulse vary exponentially with the sample's thickness. We describe a robust algorithm for extracting both the thickness and the complex index of refraction of an unknown sample. In contrast, most spectroscopic transmission measurements require accurate knowledge of the sample's thickness to determine the optical parameters. We also investigate the limits of our method

Published in:

Image Analysis and Interpretation, 2000. Proceedings. 4th IEEE Southwest Symposium

Date of Conference:

2000