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Bayes-optimality motivated linear and multilayered perceptron-based dimensionality reduction

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2 Author(s)
R. Lotlikar ; Dept. of Electr. & Comput. Eng., Cincinnati Univ., OH, USA ; R. Kothari

Dimensionality reduction is the process of mapping high-dimension patterns to a lower dimension subspace. When done prior to classification, estimates obtained in the lower dimension subspace are more reliable. For some classifiers, there is also an improvement in performance due to the removal of the diluting effect of redundant information. A majority of the present approaches to dimensionality reduction are based on scatter matrices or other statistics of the data which do not directly correlate to classification accuracy. The optimality criteria of choice for the purposes of classification is the Bayes error. Usually however, Bayes error is difficult to express analytically. We propose an optimality criteria based on an approximation of the Bayes error and use it to formulate a linear and a nonlinear method of dimensionality reduction. The nonlinear method we propose, relies on using a multilayered perceptron which produces as output the lower dimensional representation. It thus differs from autoassociative like multilayered perceptrons which have been proposed and used for dimensionality reduction. Our results show that the nonlinear method is, as anticipated, superior to the linear method in that it can perform unfolding of a nonlinear manifold. In addition, the nonlinear method we propose provides substantially better lower dimension representation (for classification purposes) than Fisher's linear discriminant (FLD) and two other nonlinear methods of dimensionality reduction that are often used

Published in:

IEEE Transactions on Neural Networks  (Volume:11 ,  Issue: 2 )