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Bridge fault diagnosis using stuck-at fault simulation

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2 Author(s)
Jue Wu ; Sun Microsyst., Menlo Park, CA, USA ; E. M. Rudnick

A new diagnostic fault simulator is described that diagnoses both feedback and nonfeedback bridge faults in combinational circuits while using information from fault simulation of single stuck-at faults. A realistic fault model is used which considers the existence of the Byzantine Generals problem. Sets representing nodes possibly involved in a defect are partitioned based on logic and fault simulation of failing vectors. The approach has been demonstrated for two-line bridge faults on several large combinational benchmark circuits containing Boolean primitives and has achieved over 98% accuracy for nonfeedback bridge faults and over 85% accuracy for feedback bridge faults with good diagnostic resolution

Published in:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems  (Volume:19 ,  Issue: 4 )