By Topic

Bridge fault diagnosis using stuck-at fault simulation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Jue Wu ; Sun Microsyst., Menlo Park, CA, USA ; Rudnick, E.M.

A new diagnostic fault simulator is described that diagnoses both feedback and nonfeedback bridge faults in combinational circuits while using information from fault simulation of single stuck-at faults. A realistic fault model is used which considers the existence of the Byzantine Generals problem. Sets representing nodes possibly involved in a defect are partitioned based on logic and fault simulation of failing vectors. The approach has been demonstrated for two-line bridge faults on several large combinational benchmark circuits containing Boolean primitives and has achieved over 98% accuracy for nonfeedback bridge faults and over 85% accuracy for feedback bridge faults with good diagnostic resolution

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:19 ,  Issue: 4 )