By Topic

Reuse of existing design information in the development of new electronic PTC devices via a neural network approach

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Xu, W.L. ; Inst. of Technol. & Eng., Massey Univ., Palmerston North, New Zealand ; Tso, S.K. ; Tso, Y.

Burning events and voltage endurance are two important aspects that need to be predicted during the design and development stage of a new series of electronic positive temperature coefficient (PTC) devices. In this paper, these problems are identified by experiments conducted on well-developed devices, and are resolved by improving the resistance-temperature characteristics of the PTC devices in order to overdamp, underdamp, or critically damp high-current/high-voltage surges. The use of neural networks is proposed, to learn the empirical or experimental design information that already exists, and then to predict the occurrence of burning events and the voltage endurance of new PTC devices at the design/development stage. Two predictive schemes are presented separately, for burning events and for voltage endurance, where the training patterns for the desired outputs are either generated from empirical formulae or collected from experiments on already-developed PTC devices. The predicted results are discussed against the experimental results that are available, and an overall concept is finally given for the integration of the neural predictive models into the computer-aided design/computer-aided engineering system used for the PTC devices

Published in:

Industrial Electronics, IEEE Transactions on  (Volume:47 ,  Issue: 2 )