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Translation of the problem of complete test set generation to pseudo-Boolean programming

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3 Author(s)
Bhattacharjee, P.R. ; Dept. of Phys., M.B.B. College, Tripura, India ; Basu, S.K. ; Paul, J.C.

An attempt is made to demonstrate that the problem of complete test set generation is amenable to the problem of pseudo-Boolean programming. For this purpose, various types of faults, viz., single faults, multiple faults, and bridging faults, are considered. The key issue is to obtain logical expressions for the primary output line in terms of different faulty internal nodes to find real transforms. Using standard rules, the real transforms of a Boolean function can be obtained directly without any algebraic manipulation

Published in:

Computers, IEEE Transactions on  (Volume:40 ,  Issue: 7 )

Date of Publication:

Jul 1991

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