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A sigma-delta modulation based BIST scheme for mixed-signal circuits

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2 Author(s)
Jiun-Lang Huang ; Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA ; Kwang-Ting Cheng

In this work, we present the analysis of a built-in self-test (BIST) scheme for mixed-signal circuits that is intended to provide on-chip stimulus generation and response analysis. Based on the sigma-delta modulation principle, the proposed scheme can produce high-quality stimuli and obtain accurate measurements without the need of precise analog circuitry. Numerical simulations are conducted to validate our idea and the results show that the scheme is a promising BIST approach for mixed-signal circuits.

Published in:

Design Automation Conference, 2000. Proceedings of the ASP-DAC 2000. Asia and South Pacific

Date of Conference:

9-9 June 2000