Referenced Items are not available for this document.
In this work, we present the analysis of a built-in self-test (BIST) scheme for mixed-signal circuits that is intended to provide on-chip stimulus generation and response analysis. Based on the sigma-delta modulation principle, the proposed scheme can produce high-quality stimuli and obtain accurate measurements without the need of precise analog circuitry. Numerical simulations are conducted to validate our idea and the results show that the scheme is a promising BIST approach for mixed-signal circuits.
Published in:
Design Automation Conference, 2000. Proceedings of the ASP-DAC 2000. Asia and South Pacific
Date of Conference: 9-9 June 2000
- Page(s):
- 605 - 610
- Meeting Date :
- 25 Jan 2000-28 Jan 2000
- Print ISBN:
- 0-7803-5973-9
- INSPEC Accession Number:
- 6597074
- Conference Location :
- Yokohama, Japan
- Digital Object Identifier :
- 10.1109/ASPDAC.2000.835172
- Product Type:
- Conference Publications
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