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Demonstration of newly invented negative-mask scanning imaging scheme using THz-radiation sources

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9 Author(s)
S. Ono ; Inst. for Molecular Sci., Okazaki, Japan ; H. Ohtake ; S. Izumida ; T. Yano
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Summary form only given. There have been strong demands for a new imaging scheme with limited light source intensity for various imaging applications. Additionally, there is no detector array with sufficient sensitivity or spatial resolution for some radiation. Therefore, scanning imaging schemes with a single detector will be required. If the object is not in an easy position to scan, a mask position scanning scheme will be desirable to enable a compact imaging system to be constructed. In such a technique, the simplest mask is a pin-hole mask. This scheme is not practical, due to the significant reduction of signal intensity with a pin-hole mask required for high spatial resolution. In this presentation, we have reported a newly invented scanning imaging scheme to solve these problems and have demonstrated it with a THz-radiation light source.

Published in:

Lasers and Electro-Optics, 1999. CLEO '99. Summaries of Papers Presented at the Conference on

Date of Conference:

28-28 May 1999