Cart (Loading....) | Create Account
Close category search window
 

Performance of high rate turbo codes employing the soft-output Viterbi algorithm (SOVA)

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Ghrayeb, A. ; Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA ; Ryan, W.E.

We examine the performance of the iterative soft-output Viterbi algorithm (SOVA) for high rate turbo codes on an additive white Gaussian noise (AWGN) channel and compare its performance to that of the a posteriori probability (APP) algorithm. Code rates of the form k/sub 0//k/sub 0/+1 (k/sub 0/=4, 8, 16, 92, and 64) are considered. In our simulations, we show that the SOVA algorithm yields a bit error probability (P/sub b/) performance that is only about 0.7 dB inferior to the performance of the APP algorithm and about 1.7 dB from the capacity limit at P/sub b/=10/sup -5/. We also examine SOVA performance as a function of the number of iterations and a parameter we call the reliability depth.

Published in:

Signals, Systems, and Computers, 1999. Conference Record of the Thirty-Third Asilomar Conference on  (Volume:2 )

Date of Conference:

24-27 Oct. 1999

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.