By Topic

The disposal to face-based representation of design/manufacturing feature integration

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Fengjun Zhang ; Adv. Manuf. Technol. Center, Harbin Inst. of Technol., China ; Huaming Liu ; Chunhua Sun

A problem of CAD/CAM integration with feature modelling is the transformation of multiple view feature information in an integration system. The treatment problem of integration with the design and machining feature is discussed in the paper. The machining feature is classified according to the removal ways of the form feature during machining. The relation between the form feature and design feature is analyzed based on machining and the rule of feature mapping is purposed. The Winged-edge database structure is used to describe the geometry/topology of the part; the feature faces are marked by the feature name during design; the face adjacency graph based on the convex and concave feature is utilized to describe machining features. Trees record the relations among features. The feature tree oriented design records the adjoint relation between the design features; the root nodes in the feature tree. Oriented machining record the form of the part, the other leaf nodes record the removal features of the part. The design feature is transformed into the machining feature by a transformation/recognition mechanism

Published in:

Vehicle Electronics Conference, 1999. (IVEC '99) Proceedings of the IEEE International

Date of Conference: