Notification:
We are currently experiencing intermittent issues impacting performance. We apologize for the inconvenience.
By Topic

Studies of the initial phases of exploding W and Al wire and wire-array plasma formation using X-ray backlighting

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Sinars, D.B. ; Lab. of Plasma Studies, Cornell Univ., Ithaca, NY, USA ; Greenly, J.B. ; Pikuz, S.A. ; Shelkovenko, T.A.
more authors

Summary form only given. Exploding W and Al wires and wire arrays have been investigated using direct (point-projection) X-ray backlighting as the principal diagnostic method. A 4.5 kA amplitude, 350 ns quarter-period rise time sinusoidal current source which damps in about 5 ps is delivered to one or more fine W (7.5, 10 or 13.5 /spl mu/m) or Al (13.5 or 25 /spl mu/m) wires approximately 6 cm away from one or two Mo X-pinch X-ray backlighter sources. The X-pinches are placed in parallel between the output electrodes of the 450 kA, 100 ns XP pulser at Cornell University, each thereby producing a sub-nanosecond X-ray pulse. The source size is small enough to permit micron-scale spatial resolution images of the exploding wires on X-ray film. By varying the relative timing between pulsing the current source for the W or Al wire or wires and the XP pulser, images of the initial explosion phase of W and Al wires have been obtained at times ranging upwards from about 100 ns after the start of the 4.5 kA current source.

Published in:

Plasma Science, 1999. ICOPS '99. IEEE Conference Record - Abstracts. 1999 IEEE International Conference on

Date of Conference:

24-24 June 1999