Cart (Loading....) | Create Account
Close category search window
 

Robust parameter estimation of a deterministic signal in impulsive noise

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Friedmann, J. ; Dept. of Electr. Eng., Tel Aviv Univ., Israel ; Messer, H. ; Cardoso, J.

This paper presents a robust class of estimators for the parameters of a deterministic signal in impulsive noise. The proposed technique has the structure of the maximum likelihood estimator (MLE) but has an extra degree of freedom: the choice of a nonlinear function (which is different from the score function suggested by the MLE) that can be adjusted to improve robustness. The effect of this nonlinear function is studied analytically via an asymptotic performance analysis. We investigate the covariance of the estimates and the loss of efficiency induced by nonoptimal choices of the nonlinear function, giving special attention to the case of α-stable noise. Finally, we apply the theoretical results to the problem of estimating the parameters of a sinusoidal signal in impulsive noise

Published in:

Signal Processing, IEEE Transactions on  (Volume:48 ,  Issue: 4 )

Date of Publication:

Apr 2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.