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Method for measuring properties of high relative dielectric constant materials in a cutoff waveguide cavity

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1 Author(s)
Y. N. Noskov ; Inst. of Res. & Prod., Ferrite Domen Co., St. Petersburg, Russia

In this paper, a method for measuring properties of ceramic materials with relative dielectric constant value of 20-150 is proposed. It permits us to eliminate the operating TM01δ-mode degeneration due to its frequency coincidence with other modes, including ones of higher order. Both that fact and the possibility of precise calculation of an unloaded quality factor for a cavity permit one to execute the accurate measurements of loss tangent values as low as (1÷0, 5)×10-4, the error of dielectric constant measurement being equal to or less than 1%. The feasibility of precise measurement of the loaded Q-factor of a cavity by the readings of micrometric probe makes the use of frequency meters unnecessary

Published in:

IEEE Transactions on Microwave Theory and Techniques  (Volume:48 ,  Issue: 3 )