By Topic

Method for appraising radar image artifacts

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
B. Borden ; Weapons Div., Naval Air Warfare Center, China Lake, CA

Expert systems are typically used to isolate radar image artifacts associated with dispersive and/or multiple target subscatterers. These subjective methods may overlook subtle image errors like intensity variations of (correctly positioned) image elements. A more objective approach-based on nonlinear Backus-Gilbert theory-shows how some of the traditional weaknesses might be avoided

Published in:

IEEE Transactions on Aerospace and Electronic Systems  (Volume:36 ,  Issue: 1 )