Cart (Loading....) | Create Account
Close category search window
 

A study on scanning methods for a field-sequential stereoscopic display

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Okui, M. ; Sci. & Tech. Res. Labs., NHK, Tokyo ; Okano, F. ; Yuyama, I.

This paper focuses on the scanning methods of a field-sequential stereoscopic display system. We examined the advantages and disadvantages of several scanning methods to identify the most suitable one for the field-sequential stereoscopic display technique. An evaluation test using a system with 525 scanning lines and a 120-Hz field frequency was conducted. The results show that the picture quality of the 4:2 or 4:1 interlace method, which maintains high vertical resolution, is superior to that of the simple 2:1 interlace one. We also developed an experimental field-sequential stereoscopic system for HDTV with 1:2 interlacing and confirmed that it is possible to display high-quality stereoscopic HDTV pictures in full 1125-line vertical resolutions

Published in:

Circuits and Systems for Video Technology, IEEE Transactions on  (Volume:10 ,  Issue: 2 )

Date of Publication:

Mar 2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.