Scheduled System Maintenance:
On Monday, April 27th, IEEE Xplore will undergo scheduled maintenance from 1:00 PM - 3:00 PM ET (17:00 - 19:00 UTC). No interruption in service is anticipated.
By Topic

A parallel technique for ATPG using genetic algorithms

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Sabry, M. ; Dept. of Comput. & Syst. Eng., Ain Shams Univ., Cairo, Egypt ; Wahba, A. ; Mahdi, H.

This paper presents a new technique for test pattern generation based on a genetic algorithm and parallel processing techniques. This new method offers compact test sets, compared to other methods, that achieve maximum coverage

Published in:

Microelectronics, 1998. ICM '98. Proceedings of the Tenth International Conference on

Date of Conference:

1998