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New scan design of asynchronous sequential circuits

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3 Author(s)
Yong-Seok Kang ; Dept. of Electr. Eng., Yonsei Univ., Seoul, South Korea ; Kyung-Hoi Huh ; Sungho Kang

In this paper a new scan design for detection of stuck-at faults and delay faults in asynchronous sequential circuits based on the micropipeline approach is proposed. This new scan methodology can gain the high fault coverage of path delay fault as well as stuck-at fault with the small area overhead in the asynchronous micropipeline environments and easily expand the application such as built-in self testing

Published in:

ASICs, 1999. AP-ASIC '99. The First IEEE Asia Pacific Conference on

Date of Conference:

1999