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Standard testability bus-an applications example

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1 Author(s)
Turino, J. ; Logical Solutions Technol. Inc., Campbell, CA, USA

Summary form only given. The standard testability bus may be implemented in a variety of ways according to the requirements of each specific application. The author describes the application of a standard testability bus to the design of a next-generation automatic test system. The approach selected was protocol independent and could thus support any combination of boundary scannable, VHSIC, and commercially available functional circuitry. The result of the present approach was the ability to meet the system-level testability specifications while at the same time reducing the time and cost associated with design verification, logic and fault simulation, capital equipment cost for external ATE (automatic test equipment), and on-going factory and field testing and troubleshooting

Published in:

Test Conference, 1989. Proceedings. Meeting the Tests of Time., International

Date of Conference:

29-31 Aug 1989