Cart (Loading....) | Create Account
Close category search window
 

Standard testability bus-an applications example

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Turino, J. ; Logical Solutions Technol. Inc., Campbell, CA, USA

Summary form only given. The standard testability bus may be implemented in a variety of ways according to the requirements of each specific application. The author describes the application of a standard testability bus to the design of a next-generation automatic test system. The approach selected was protocol independent and could thus support any combination of boundary scannable, VHSIC, and commercially available functional circuitry. The result of the present approach was the ability to meet the system-level testability specifications while at the same time reducing the time and cost associated with design verification, logic and fault simulation, capital equipment cost for external ATE (automatic test equipment), and on-going factory and field testing and troubleshooting

Published in:

Test Conference, 1989. Proceedings. Meeting the Tests of Time., International

Date of Conference:

29-31 Aug 1989

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.