By Topic

Analysis of leakage current induced nonlinearity in resistor-ladder based data converters

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Maulik, P.C. ; Crystal Semicond. Products Div., Cirrus Logic Inc., Austin, TX, USA

This work analyzes nonlinearities caused by leakage currents in resistor-ladder based data converters. Expressions are derived for integral and differential nonlinearity

Published in:

Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on  (Volume:47 ,  Issue: 2 )