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A polarization-dependent loss measurement of Zn indiffusion (ZI) waveguide on a Y-cut LiNbO/sub 3/ substrate is firstly reported. The measured results show that the waveguides support either a single extraordinary polarization or both extraordinary and ordinary polarizations depending on the fabrication process parameters. For the single extraordinary polarization waveguide, the measured propagation loss at 1.32-/spl mu/m wavelength is 0.9 dB/cm and the best measured polarization extinction ratio is 44 dB at a distance of 1.5 cm from the input end, which are quite good for being a waveguide polarizer. Moreover, the voltage-length product measured for the ZI Mach-Zehnder modulator shows that the substrate electrooptic coefficient is not degraded.