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Software reliability models with time-dependent hazard function based on Bayesian approach

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2 Author(s)
Pham, L. ; Dept. of Ind. Eng., Rutgers Univ., Piscataway, NJ, USA ; Pham, H.

In this paper, two models predicting mean time until next failure based on Bayesian approach are presented. Times between failures follow Weibull distributions with stochastically decreasing ordering on the hazard functions of successive failure time intervals, reflecting the tester's intent to improve the software quality with each corrective action. We apply the proposed models to actual software failure data and show they give better results under sum of square errors criteria as compared to previous Bayesian models and other existing times between failures models. Finally, we utilize likelihood ratios criterion to compare new model's predictive performance

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Systems, Man and Cybernetics, Part A: Systems and Humans, IEEE Transactions on  (Volume:30 ,  Issue: 1 )