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Mainstream ATE: to reduce LSI and VLSI test cost

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2 Author(s)
Salter, M.W. ; STS, Burlington, MA, USA ; Taschioglou, K.

It is proposed that test costs for LSI and VLSI mainstream devices be reduced by matching performance requirements with manufacturing strategy. The approach is to complement ATE (automatic test equipment) for testing leading-edge devices by ATE with the appropriate requirements for testing families of mainstream devices

Published in:

Test Conference, 1989. Proceedings. Meeting the Tests of Time., International

Date of Conference:

29-31 Aug 1989

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