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On finding a minimal functional description of a finite-state machine for test generation for adjacent machines

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2 Author(s)
Pomeranz, I. ; Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA ; Reddy, S.M.

In some applications, it is desirable to find for a circuit a minimal partial description that allows a certain task to be carried out. A partial circuit description allows the task to be carried out more efficiently since fewer decision points exist based on a partial description compared to the full circuit description. We consider this problem with respect to finite state machines and the following tasks. Starting from a functional description of a finite state machine M in the form of a state table ST, we select a minimal subset of state-transitions STpart⊂ST such that every output sequence that can be produced using state-transitions out of ST can also be produced using state-transitions out of STpart. We also formulate a similar problem related to the propagation of fault effects from the inputs to the outputs of M and describe a procedure for solving this problem. Applications of these tasks include test generation for circuits described as interconnections of finite-state machines. Experimental results presented show that STpart contains a small fraction of the state-transitions of ST

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Computers, IEEE Transactions on  (Volume:49 ,  Issue: 1 )