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Browse Conference Publications > Africon, 1999 IEEE ... Help

Development of a material phase detection system using capacitance tomography

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3 Author(s)
Smit, Q. ; Sch. of Electr. Eng., Cape Technikon, Cape Town, South Africa ; Tapson, J. ; Mortimer, B.J.P.

Information on the material, phase and distribution within industrial mass-transfer systems is required for system control. This paper describes the development of a versatile self-tuning capacitance/conductance sensor system that can be used as a tomographic system to image the contents within a pipeline

Published in:
Africon, 1999 IEEE  (Volume:2 )

Date of Conference: 1999

Page(s):
927 - 928 vol.2
Meeting Date :
28 Sep 1999-01 Oct 1999
Print ISBN:
0-7803-5546-6
INSPEC Accession Number:
6513983
Conference Location :
Cape Town
Digital Object Identifier :
10.1109/AFRCON.1999.821894
Product Type:
Conference Publications

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