Referenced Items are not available for this document.
A description is given of the Diodes system, a complete rapid prototyping, debugging, and test environment including both hardware and software, for the design of digital-signal-processing chips. The test circuitry in Diodes differs from that in many systems, including those based on boundary scan, by offering full-speed circuit testing and the observation of internal nodes during real time. Diodes also achieves nearly 100% fault coverage because chips are composed of numerous chunks, each of which is tested exhaustively. The discussion covers the high-density interconnection technology and the concepts on which Diodes is based, two types of chips that have been designed, fabricated, and tested for Diodes: module assembly and fabrication; synthesis software; on-chip testing; Diodes test circuitry; test modes; and hardware and software debugging. Diodes is compared with other testing approaches and other rapid prototyping systems.<
Published in:
Design & Test of Computers, IEEE
(Volume:8
,
Issue:
2
)
Date of Publication: June 1991
- Page(s):
- 11 - 25
- ISSN :
- 0740-7475
- INSPEC Accession Number:
- 3970354
- Digital Object Identifier :
- 10.1109/54.82035
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- June 1991
- Sponsored by :
- IEEE Council on Electronic Design and Automation
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