Cart (Loading....) | Create Account
Close category search window

CAFNA/sup (R)/, coded aperture fast neutron analysis for contraband detection: preliminary results

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Zhang, L. ; Dept. of Nucl. Eng., MIT, Cambridge, MA, USA ; Lanza, R.C.

We have developed a near field coded aperture imaging system for use with fast neutron techniques as a tool for the detection of contraband and hidden explosives through nuclear elemental analysis. The technique relies on the prompt gamma rays produced by fast neutron interactions with the object being examined. The position of the nuclear elements is determined by the location of the gamma emitters. For existing fast neutron techniques, in pulsed fast neutron analysis (PFNA), neutrons are used with very low efficiency; in fast neutron analysis (FNA), the sensitivity for detection of the signature gamma rays is very low. For the coded aperture fast neutron analysis (CAFNA/sup (R)/) we have developed, the efficiency for both using the probing fast neutrons and detecting the prompt gamma rays is high.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:46 ,  Issue: 6 )

Date of Publication:

Dec. 1999

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.