Cart (Loading....) | Create Account
Close category search window
 

Using physical and simulated fault injection to evaluate error detection mechanisms

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Constantinescu, C. ; Intel Corp., Hillsboro, OR, USA

Effective error detection is paramount for building highly dependable computing systems. A new methodology, based on physical and simulated fault injection, is developed for evaluating error detection mechanisms. Our approach consists of two steps. First, transient faults are physically injected at the IC pin level of a prototype server. Experiments are carried our in a three dimensional space of events, the location, time of occurrence and duration of the fault being randomly selected. Improved detection circuitry is devised for decreasing signal sensitivity to transients. Second, simulated fault injection is performed to asses the effectiveness of the new detection mechanisms, without using expensive silicon implementations. Physical fault injection experiments, carried out on the server, and simulated fault injection, performed on protocol checker, are presented. Detection effectiveness is measured by the error detection coverage, defined as the conditional probability that an error is detected given that an error occurs. Fault injection reveals that coverage probability is a function of fault duration. The protocol checker significantly improves error detection. Although, further research is required to increase detection coverage of the errors induced by short transient faults

Published in:

Dependable Computing, 1999. Proceedings. 1999 Pacific Rim International Symposium on

Date of Conference:

1999

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.