Cart (Loading....) | Create Account
Close category search window
 

A novel NMR structure with concurrent output error location capability

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Jianhui Jiang ; Inst. of Comput. Technol., Shanghai Tiedao Univ. ; Hongbao Shi ; Xiaodong Zhao

This paper proposes a novel N-modular redundancy (NMR) structure with concurrent output error location (COEL) capability. The concurrent output error locatable NMR structure consists of a conventional NMR structure and a totally self-checking (TSC) extra circuit with N+1 two-rail code outputs. This extra circuit is used for locating the output error produced by any replicated module or the voter, and the internal fault produced by the extra circuit itself. Such a self-checking extra circuit is called the output error locator (OEL). It is constructed by conventional TSC two-rail code checkers (TRCs) and self-testing multi-input comparators. Each comparator is made by adding one extra two-rail code input to the cascaded multi-input comparator. The error handling capabilities, hardware complexity and propagation delay are analyzed for the proposed OEL. The performance of the proposed scheme and that of the Gaitanis's scheme are compared for a triple modular redundancy (TMR) structure

Published in:

Dependable Computing, 1999. Proceedings. 1999 Pacific Rim International Symposium on

Date of Conference:

1999

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.