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Radiation testing results of COTS based space microcircuits

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10 Author(s)
P. Layton ; Space Electron. Inc., San Diego, CA, USA ; H. Anthony ; R. Boss ; N. Hall
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Single Event Effects and Total Ionizing dose data collected by SEi for Commercial off the Shelf (COTS) microcircuits are presented. The data was collected for evaluation of these devices for commercial space programs

Published in:

Radiation Effects Data Workshop, 1999

Date of Conference:

1999