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Single event upset characteristics of some digital integrated frequency synthesizers

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4 Author(s)
Dayaratna, L. ; Lockheed Martin Commun. & Power Center, Newtown, PA, USA ; Seehra, S.S. ; Bogorad, A. ; Ramos, L.G.

Frequency generation circuits can be designed by using digital integrated circuit frequency synthesizers containing phase locked loops. Many circuits in ECL, Bi-CMOS and CMOS-SOS technology presently exist, making it easier to develop systems with frequencies up to 2.5 GHz and beyond. Single Event Upset (SEU) characteristics of digital frequency synthesizers from National Semiconductor (LMX2315), Peregrine (PE3282A) and Mitel (SP8855 and SP8858) are presented. Depending upon the device technology and manufacturing process, the upset rate can be significant that they may not be suitable for high reliability space applications

Published in:

Radiation Effects Data Workshop, 1999

Date of Conference:

1999