Cart (Loading....) | Create Account
Close category search window
 

Modular fault diagnosis based on discrete event systems for a mixer chemical process

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Garcia, E. ; Dept. of Eng. Syst. Comput. & Autom., Polytech. Univ. of Valencia, Spain ; Morant, F.

The knowledge of failure type and their location is an indispensable requirement for the establishment of tasks of adequate recovery strategies and maintenance of both factory automation and process control systems. The failure diagnosis methodology presented in the paper is based on discrete event systems models and on the diagnosers concept, those which permit the analysis off-line and online of diagnosability of failures that can occur in the processes. We present an approach for models and associated diagnosers based on a modular decomposition of the global system, with the purpose of avoiding the problems of the exponential explosion of the number of states and of the computational complexity of the diagnosis process

Published in:

Emerging Technologies and Factory Automation, 1999. Proceedings. ETFA '99. 1999 7th IEEE International Conference on  (Volume:2 )

Date of Conference:

1999

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.