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Burst immunity tests according to IEC 1000-4-4 standard used to improve design of a new integrated power function

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3 Author(s)
Magnon, D. ; Power Microelectron. Lab., Tours, France ; Feybesse, A. ; Guitton, F.

Any electronics application has to satisfy immunity requirements concerning electromagnetic perturbations. This immunity can be ratified by the IEC 1000-4-4 standard, which does not allow for the testing of a single device. In order to achieve the results, we had to design a test method. The results we got from a new integrated power function are satisfactory for they confirm the reliability of the device and allow us to keep or improved the design

Published in:

Electromagnetic Compatibility, 1999 IEEE International Symposium on  (Volume:1 )

Date of Conference:

1999